NEW QFN TEST & BURN-IN SOCKET SERIES WITH 0.5 MM PITCH
YAMAICHI ELECTRONICS introduces three new series of QFN sockets - the NP473, NP404 and NP474 with 0.5mm pitch and an open-top design - for test & burn-in applications.
The new open-top QFN socket series feature a highly precise 0.5mm fine-pitch contact system, as well as a compact modular socket design. In addition to simplifying the automated loading/unloading of burn-in boards, the new devices help reduce changeover times and cost. Their modular design with standard socket scaling provides highest reliability and simplicity, thus assuring that they meet all test & burn-in requirements. YAMAICHI's new QFN series furthermore offer ease of integration with a variety of burn-in board loader systems.
The modular construction and different guide post designs (for IC-specific positioning) permits the adaptation and testing of different IC types with only one base socket size.
The outer dimensions of the sockets are:
NP473 series: 25.0mm x 25.0mm x 20.5mm / applicable to odd pin counts on each side (ICs with 12 - 44 pins)
NP404 series: 32.0mm x 32.0mm x 20.5mm / applicable to even pin counts on each side (ICs with 16 to 88 pins)
NP474 series: 45.0mm x 45.0mm x 20.5mm / applicable to odd pin counts on each side or in two rows (ICs with 52 to 124 pins)
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Highest Contact Reliability
The contact mechanism features a buckling beam contact design with a coined contact tip, while zero insertion force mating minimizes wear of the IC during loading and unloading. When the push cover is pressed down, the IC is securely guided into the socket. When the push-cover is released, the latch mechanism presses onto the surface of the IC to ensure proper seating and a highly reliable contact. The contact mechanism thus guarantees the ideal contact force, as well as a very low and stable contact transfer resistance.
If the above has piqued your interest, don't hesitate to call me for more information!
René Haller, EXT 136
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