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HIGH COMPLEXITY TEST APPLICATIONS FROM YAMAICHI!

2008-09-01  YAMAICHI

YAMAICHI ELECTRONICS presents another development milestone: The design center for test applications has successfully extended and implemented its high complexity mixed signal Device Interface Board (DIB) product spectrum for Teradyne tester platforms.

YAMAICHI ELECTRONICS DEUTSCHLAND GmbH is a competent industry partner for complete semiconductor test systems – beginning with contact solutions for a variety of semiconductor components and their multitude of packages, to both manual and automatic tests, and through to complex and highly integrated test applications. All design projects are subject to customer-specified, as well as internal, design rules (design guidelines) with regard to EMC compatibility, signal integrity and signal conditioning. Design-accompanying, goal-oriented observation, together with analyses gained from simulations and their derivations, continually impact the development effort and expected results. YAMAICHI’s Munich-based European Design Center is equipped with 36 CAE/CAD work stations, as well as state-of-the-art test and lab equipment. The ideal location in the heart of Central Europe helps establish a closeness to customers, thus guaranteeing the quickest possible reaction time for meeting requirements and modification requests – and this is reflected in a fully optimized customer layout.

The list of reference customers who have already placed their trust in Yamaichi for projects leading to the successful development of customized test applications include such renowned names as Bosch, Dialog, Infineon, Qimonda, Micronas and Texas Instruments.



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