Munich, February 2015 YAMAICHI Electronics presents test contactors for Machine-to-Machine (M2M) modules. M2M modules allow the interconnection of electronics apparatus and enable automated communication to provide wireless control and real-time monitoring.
The M2M modules can manage global positioning and data transmission in industrial, consumer and automotive products.
For testing such modules, YAMAICHI Electronics developed a test contactor solution within the YED274 series. The contactor is individually modified for the different M2M module outlines and can be used for applications like
• evaluation bench tests,
• reliability test from -50°C up to 150°C.
Through YAMAICHI Electronics' experience in developing test & burn-in sockets, the opening and closing mechanism is designed for easy handling. The socket is designed with compression mount technology, therefore no soldering is needed. Selected materials like aircraft aluminum, PEEK and ceramic PEEK make the socket robust.
Reliable Probe Pin Technology
Most of the M2M modules have gold pads as contacting surface. The best contact technology for such surface areas are fine pitch probe pins. The pins, known from semiconductor testing, have a long life time of more than 500k mechanical cycles.*
For contacting the module pads, a conical type plunger tip is commonly used. By using such a tip it can be assured that only a very small witness mark is formed on the module contact pad. The fine-pitch pins are available for pitches starting from 0.3mm. There are also Kelvin type pins available.
*) The life time cycle may vary according to the usage of the pins in harsh environment, at high temperature or on contact surfaces other than gold. More details can be provided on requirement.
The datasheet for M2M modules is available for download.